Phenological corrections to a field-scale, ET-based crop stress indicator: An application to yield forecasting across the U.S. Corn Belt
By:
- Yang, Yang
- Anderson, Martha C.
- Gao, Feng
- Johnson, David M.
- Yang, Yun
- Sun, Liang
- Dulaney, Wayne
- Hain, Christopher R.
- Otkin, Jason A.
- Prueger, John
- Meyers, Tilden P.
- Bernacchi, Carl J.
- Moore, Caitlin E.