Investigation of GOES imager 13 micron channel cold bias
By:
- Wu, X.
- Schmit, T.
- Galvin, R.
- Gunshor, M.
- Hewison, T.
- Koenig, M.
- Tahara, Y.
- Blumstein, D.
- Li, Y.
- Sohn, S.
- Goldberg, M.